MicronView has launched a 0.1 µm Airborne Particle Counter (APC) designed for cleanroom environments where submicron contamination is a critical process variable.

In the spring of March, MicronView partners from all over the world gathered together to usher in a landmark moment - MicronView's first global dealer summit.

Contamination investigations are rarely theoretical exercises. They happen mid-shift, under production pressure, with QA, operations, and manufacturing all waiting for answers. In cleanroom environments, even a single excursion can trigger immediate concern around product impact, personnel practices, and facility control.

Environmental monitoring might sound simple: collect air samples, record data, and move on. But anyone who has spent time in a cleanroom knows it is anything but. Between gowning, disinfecting, carrying equipment, labeling plates, and logging results, a “quick” sampling round can easily consume most of a shift.